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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Optical Components and Materials VIII - Photocurrent spectrum measurements of doped black silicon
Zhang, S. K., Digonnet, Michel J. F., Jiang, Shibin, Ahmar, H., Chen, B., Glesener, John W., Dries, J. Christopher, Wang, W., Alfano, R.Volume:
7934
Year:
2011
Language:
english
DOI:
10.1117/12.874368
File:
PDF, 266 KB
english, 2011