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SPIE Proceedings [SPIE Fourth International Seminar on Modern Cutting and Measuring Engineering - Beijing, China (Friday 10 December 2010)] Fourth International Seminar on Modern Cutting and Measurement Engineering - Dynamic errors modeling of CMM based on generalized regression neural network
Zhong, Weihong, Xin, Jiezhi, Zhu, Lianqing, Guan, Hongwei, Li, Yingdao, Wang, Zhongyu, Ma, XiushuiVolume:
7997
Year:
2010
Language:
english
DOI:
10.1117/12.888558
File:
PDF, 399 KB
english, 2010