SPIE Proceedings [SPIE 10th International Conference on Quality Control by Artificial Vision - Saint-Etienne, France (Tuesday 28 June 2011)] Tenth International Conference on Quality Control by Artificial Vision - Secondary radiations in CBCT: a simulation study
Pinoli, Jean-Charles, Wils, Patricia, Létang, Jean M., Debayle, Johan, Gavet, Yann, Bruandet, Jean-Pierre, Gruy, Frédéric, Lambert, ClaudeVolume:
8000
Year:
2011
Language:
english
DOI:
10.1117/12.890510
File:
PDF, 512 KB
english, 2011