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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications - 3D shape measurement based on Hilbert transform
Wang, Fengpeng, Xie, Yingmao, Guo, Jinshui, Yin, Zhen, Chen, LipingVolume:
8194
Year:
2012
Language:
english
DOI:
10.1117/12.903180
File:
PDF, 774 KB
english, 2012