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SPIE Proceedings [SPIE SPIE LASE - San Francisco, California, USA (Saturday 21 January 2012)] Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XII - On the role of the scanning line density on the etching of fused silica specimens exposed to femtosecond lasers pulses
Bellouard, Yves, Said, Ali A., Dugan, Mark, Bado, Philippe, Heisterkamp, Alexander, Meunier, Michel, Nolte, StefanVolume:
8247
Year:
2012
Language:
english
DOI:
10.1117/12.910294
File:
PDF, 13.82 MB
english, 2012