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SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Characterization of Very High Speed Semiconductor Devices and Integrated Circuits - Ultrahigh Speed Evaluation Of GaAs ICs For Engineering Characterization And Production Test: Problems And Approaches
Eden, Richard C., Clarke, J. Elwood, Jain, Ravinder K.Volume:
795
Year:
1988
Language:
english
DOI:
10.1117/12.940932
File:
PDF, 311 KB
english, 1988