SPIE Proceedings [SPIE 1988 Semiconductor Symposium - Newport Beach, CA (Monday 14 March 1988)] Spectroscopic Characterization Techniques for Semiconductor Technology III - Photoreflectance Study of Ion-implanted CdTe
Amirtharaj, P. M., Bowman, Jr., R. C., Alt, R. L., Glembocki, Orest J., Pollak, Fred H., Ponce, Fernando A.Volume:
946
Year:
1988
Language:
english
DOI:
10.1117/12.947413
File:
PDF, 584 KB
english, 1988