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SPIE Proceedings [SPIE Solving Quality Control & Reliability Problems with Optics - San Diego (Thursday 15 May 1975)] Solving Quality Control and Reliability Problems with Optics - Quality Control By Diffraction Pattern Analysis
Mead, Donald C., Kasdan, Harvey L., Middleton, Thomas J., Amodei, Juan J., Lowell, Harry N.Volume:
60
Year:
1975
Language:
english
DOI:
10.1117/12.954387
File:
PDF, 252 KB
english, 1975