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SPIE Proceedings [SPIE 23rd Annual Technical Symposium - San Diego (Monday 27 August 1979)] Interferometry - Development Of Nomarski Microscopy For Quantitative Determination Of Surface Topography(A)
Hartman, J. S., Gordon,, R. L., Lessor, D. L., Hopkins, George W.Volume:
192
Year:
1979
Language:
english
DOI:
10.1117/12.957861
File:
PDF, 2.60 MB
english, 1979