![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2012 - Constanta, Romania (Thursday 23 August 2012)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VI - A new method for shape assessment of buried objects
Neamtu, Catalin, Gavriloaia, Mariuca-Roxana, Gavriloaia, Gheorghe, Schiopu, Paul, Tamas, RazvanVolume:
8411
Year:
2012
Language:
english
DOI:
10.1117/12.970379
File:
PDF, 556 KB
english, 2012