A General Model for the Analysis of Mark-Resight,...

A General Model for the Analysis of Mark-Resight, Mark-Recapture, and Band-Recovery Data under Tag Loss

Paul B. Conn, William L. Kendall and Michael D. Samuel
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Volume:
60
Language:
english
Journal:
Biometrics
DOI:
10.2307/3695469
Date:
December, 2004
File:
PDF, 1.72 MB
english, 2004
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