A General Model for the Analysis of Mark-Resight, Mark-Recapture, and Band-Recovery Data under Tag Loss
Paul B. Conn, William L. Kendall and Michael D. SamuelVolume:
60
Language:
english
Journal:
Biometrics
DOI:
10.2307/3695469
Date:
December, 2004
File:
PDF, 1.72 MB
english, 2004