[IEEE 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2016.4.25-2016.4.27)] 2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - An IR-drop guided test pattern generation technique
Tsai, Li-Chen, Li, Jiun-Zong, Lin, Yi-Tsung, Huang, Jiun-Lang, Shih, Ann, Conroy, Zoe F.Year:
2016
Language:
english
DOI:
10.1109/vlsi-dat.2016.7482581
File:
PDF, 182 KB
english, 2016