![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation 2012 - Chengdu, China (Wednesday 8 August 2012)] Eighth International Symposium on Precision Engineering Measurement and Instrumentation - Characterization of nanoline based on SEM images
Wang, Chen-ying, Yang, Shu-ming, Lin, Qi-jing, Jiang, Zhuang-de, Lin, JieVolume:
8759
Year:
2013
Language:
english
DOI:
10.1117/12.2014506
File:
PDF, 294 KB
english, 2013