SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Optics for High-Brightness Synchrotron Radiation Beamlines II - Scanning probe microscopy and how it can be utilized in the manufacture of diffraction gratings
Bach, Bernhard W., Berman, Lonny E., Arthur, JohnVolume:
2856
Year:
1996
Language:
english
DOI:
10.1117/12.259873
File:
PDF, 381 KB
english, 1996