SPIE Proceedings [SPIE International Conference on Advanced Optical Materials and Devices - Riga, Latvia (Monday 26 August 1996)] Optical Organic and Semiconductor Inorganic Materials - Use of the Muller matrix for calculating the polarization characteristics of semiconductor thermal emission
Morozhenko, Vasiliy A., Kollyukh, Alexej G., Merker, R., Silinsh, Edgar A., Medvids, Arthur, Lusis, Andrejs R., Ozols, Andris O.Volume:
2968
Year:
1997
Language:
english
DOI:
10.1117/12.266825
File:
PDF, 113 KB
english, 1997