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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Process Imaging for Automatic Control - Multivariate approach to obtain real-time behavior of image processing applications
Berndorfer, Thomas, Eitzinger, Christian, Brenner, Alexander W., van Dyck, Walter, McCann, Hugh, Scott, David M.Volume:
4188
Year:
2001
Language:
english
DOI:
10.1117/12.417160
File:
PDF, 225 KB
english, 2001