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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] X-Ray Mirrors, Crystals, and Multilayers II - Topography measurement of nanometer synchrotron optics
Illemann, Jens, Geckeler, Ralf D., Weingartner, Ingolf, Schlewitt, Carsten, Grubert, Bernd, Schnabel, Olaf, Freund, Andreas K., Macrander, Albert T., Ishikawa, Tetsuya, Wood, James L.Volume:
4782
Year:
2002
Language:
english
DOI:
10.1117/12.450982
File:
PDF, 593 KB
english, 2002