SPIE Proceedings [SPIE International Symposium on Optical...

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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Electro-Optical System Design, Simulation, Testing, and Training - Virtual prototyping with Data Modeling

Jaenisch, Holger M., Handley, James W., White, Kent H., Watson, Jr., James W., Case, Carl T., Songy, Claude G., Wasserman, Richard M., DeVore, Scott L.
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Volume:
4772
Year:
2002
Language:
english
DOI:
10.1117/12.451755
File:
PDF, 221 KB
english, 2002
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