SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications VIII - Measurement of the complex index of refraction of semiconductors
Zito, Richard R., Yu, Francis T. S., Guo, RuyanVolume:
4803
Year:
2002
Language:
english
DOI:
10.1117/12.452621
File:
PDF, 91 KB
english, 2002