SPIE Proceedings [SPIE Integrated Optoelectronics Devices - San Jose, CA (Saturday 25 January 2003)] Ultrafast Phenomena in Semiconductors VII - Large electric-filed induced electron drift velocity observed in InxGal-xAs-based p-i-n semiconductor nanostructures
Liang, W., Tsen, Kong-Thon F., Wu, Meng-Chyi, Ho, Chong-Long, Ho, Wen-Jeng, Tsen, Kong-Thon F., Song, Jin-Joo, Jiang, HongxingVolume:
4992
Year:
2003
Language:
english
DOI:
10.1117/12.479506
File:
PDF, 144 KB
english, 2003