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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Characterization of polarization aberrations in liquid crystal devices
Wolfe, Justin, Duparre, Angela, Singh, Bhanwar, Chipman, RussellVolume:
5188
Year:
2003
Language:
english
DOI:
10.1117/12.505871
File:
PDF, 60 KB
english, 2003