SPIE Proceedings [SPIE Optical Systems Design - St....

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SPIE Proceedings [SPIE Optical Systems Design - St. Etienne, France (Tuesday 30 September 2003)] Optical Fabrication, Testing, and Metrology - New tools for high-precision positioning of optical elements in high-NA microscope objectives

Heil, Joachim, Geyl, Roland, Rimmer, David, Bauer, Tobias, Mueller, Willi, Wang, Lingli, Sure, Thomas, Wesner, Joachim
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Volume:
5252
Year:
2003
Language:
english
DOI:
10.1117/12.512835
File:
PDF, 1.42 MB
english, 2003
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