SPIE Proceedings [SPIE NanoScience + Engineering - San...

  • Main
  • SPIE Proceedings [SPIE NanoScience +...

SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 26 August 2007)] Instrumentation, Metrology, and Standards for Nanomanufacturing - Computational modeling of laser-induced self-organization in nanoscopic metal films for predictive nanomanufacturing

Trice, Justin, Postek, Michael T., Allgair, John A., Kalyanaraman, Ramki, Sureshkumar, Radhakrishna
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6648
Year:
2007
Language:
english
DOI:
10.1117/12.734510
File:
PDF, 319 KB
english, 2007
Conversion to is in progress
Conversion to is failed