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SPIE Proceedings [SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 26 August 2007)] Instrumentation, Metrology, and Standards for Nanomanufacturing - Computational modeling of laser-induced self-organization in nanoscopic metal films for predictive nanomanufacturing
Trice, Justin, Postek, Michael T., Allgair, John A., Kalyanaraman, Ramki, Sureshkumar, RadhakrishnaVolume:
6648
Year:
2007
Language:
english
DOI:
10.1117/12.734510
File:
PDF, 319 KB
english, 2007