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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Influence of the technological parameters of ion exchange on the repeatability of refractive index profiles of waveguides
Rogoziński, Roman, Dorosz, Jan, Romaniuk, Ryszard S., Wolinski, Tomasz R.Year:
2012
Language:
english
DOI:
10.1117/12.804517
File:
PDF, 340 KB
english, 2012