SPIE Proceedings [SPIE Ninth International Symposium on...

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SPIE Proceedings [SPIE Ninth International Symposium on Laser Metrology - Unknown, Singapore (Monday 30 June 2008)] Ninth International Symposium on Laser Metrology - Static and dynamic 3D contouring by using structured light

Rodriguez-Vera, R., Quan, Chenggen, Asundi, Anand, Vasquez, D., Genovese, K., Rayas, J. A., Mendoza-Santoyo, F.
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Volume:
7155
Year:
2008
Language:
english
DOI:
10.1117/12.814584
File:
PDF, 1.13 MB
english, 2008
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