SPIE Proceedings [SPIE 10th International Conference on Quality Control by Artificial Vision - Saint-Etienne, France (Tuesday 28 June 2011)] Tenth International Conference on Quality Control by Artificial Vision - Measuring image sharpness for a computer vision-based Vickers hardness measurement system
Pinoli, Jean-Charles, Maier, A., Niederbrucker, G., Debayle, Johan, Gavet, Yann, Uhl, A., Gruy, Frédéric, Lambert, ClaudeVolume:
8000
Year:
2011
Language:
english
DOI:
10.1117/12.890895
File:
PDF, 3.41 MB
english, 2011