SPIE Proceedings [SPIE 10th International Conference on Quality Control by Artificial Vision - Saint-Etienne, France (Tuesday 28 June 2011)] Tenth International Conference on Quality Control by Artificial Vision - An algorithm for a progressive acquisition image sensor
Pinoli, Jean-Charles, Leni, Pierre-Emmanuel, Fougerolle, Yohan D., Debayle, Johan, Gavet, Yann, Truchetet, Frédéric, Gruy, Frédéric, Lambert, ClaudeVolume:
8000
Year:
2011
Language:
english
DOI:
10.1117/12.890904
File:
PDF, 1.40 MB
english, 2011