SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 22 January 2012)] Image Processing: Machine Vision Applications V - Runway hazard detection in poor visibility conditions
Jiang, Bo, Rahman, Zia-ur, Bingham, Philip R., Lam, Edmund Y.Volume:
8300
Year:
2012
Language:
english
DOI:
10.1117/12.904982
File:
PDF, 13.20 MB
english, 2012