SPIE Proceedings [SPIE Techincal Symposium East -...

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SPIE Proceedings [SPIE Techincal Symposium East - Washington, D.C. (Tuesday 17 April 1979)] Smart Sensors - Programmable Charge-Coupled Device (CCD) Correlator For Pattern Classification

Mayer, D. J., Eversole, W. L., Hewes, C. R., Benz, H. F., Barbe, David F.
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Volume:
178
Year:
1979
Language:
english
DOI:
10.1117/12.957285
File:
PDF, 7.23 MB
english, 1979
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