SPIE Proceedings [SPIE SPECKLE 2012: V International Conference on Speckle Metrology - Vigo, Spain (Monday 10 September 2012)] Speckle 2012: V International Conference on Speckle Metrology - Development of a portable ESPI system for the analysis in situ of mural paintings
Boaglio, E., Lamas, J., López, Ana J., Ramil, A., Pereira, L., Prieto, B., Silva, B., Doval, Ángel F., Trillo, CristinaVolume:
8413
Year:
2012
Language:
english
DOI:
10.1117/12.978263
File:
PDF, 4.04 MB
english, 2012