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Continuations from generalized stack inspection
Pettyjohn, Greg, Clements, John, Marshall, Joe, Krishnamurthi, Shriram, Felleisen, MatthiasVolume:
40
Language:
english
Journal:
ACM SIGPLAN Notices
DOI:
10.1145/1090189.1086393
Date:
September, 2005
File:
PDF, 208 KB
english, 2005