New Approach on Quantification of Porosity of Thin Films...

Analytical Chemistry 2016 / 07 Vol. 88; Iss. 14

New Approach on Quantification of Porosity of Thin Films via Electron-Excited X-ray Spectra

Ortel, Erik, Hertwig, Andreas, Berger, Dirk, Esposito, Pasquale, Rossi, Andrea M., Kraehnert, Ralph, Hodoroaba, Vasile-Dan
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Volume:
88
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/acs.analchem.6b00847
Date:
July, 2016
File:
PDF, 1.44 MB
english, 2016
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