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Morphology of multilayer Ag/Ag(100) films versus deposition temperature: STM analysis and atomistic lattice-gas modeling
Caspersen, K. J., Stoldt, C. R., Layson, A. R., Bartelt, M. C., Thiel, P. A., Evans, J. W.Volume:
63
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.63.085401
Date:
January, 2001
File:
PDF, 1.45 MB
english, 2001