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SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Machine Vision Applications in Industrial Inspection - Adaptive texture filtering for defect inspection in ultrasound images
Zmola, Carl, Segal, Andrew C., Lovewell, Brian, Nash, Charles, Wu, Frederick Y., Dawson, Benjamin M.Volume:
1907
Year:
1993
Language:
english
DOI:
10.1117/12.144806
File:
PDF, 276 KB
english, 1993