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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - High-accuracy measurement of dimensional minichanges of large-size components with laser interferometry
Xu, Jun, Zhu, Li, Yuan, YiBao, Ding, Zhen-Liang, Li, Hua, Chen, ZhongVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156256
File:
PDF, 214 KB
english, 1993