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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - In-process monitoring of resistance spot welding
Kamat, Y. V., Zhu, Li, Lagoo, K. D.Volume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156264
File:
PDF, 813 KB
english, 1993