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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Real-time reflective holographic interferometry
Zhuang, Wyman Z., Zhu, Li, Baird, John P., Williamson, Hugh M., Clark, Robert K.Volume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156362
File:
PDF, 348 KB
english, 1993