SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Thermal EMF method for monitoring drilling tool wear
Pan, Haili, Zhu, Li, An, Bangjian, Chen, Yu-bao, Orady, ElsayedVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156418
File:
PDF, 643 KB
english, 1993