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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Flatness measurement of a very-large-diameter plate on a machine tool by error-separation method
He, Zhen, Zhu, Li, Liu, Xingzhan, Liang, JinwenVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156492
File:
PDF, 128 KB
english, 1993