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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XII - In-situ measurement of reflectance and DC-resistivity of thin silver films in multilayer interference filters
Eisenhammer, Thomas, Muggenthaler, F., Sizmann, R., Lampert, Carl M.Volume:
2017
Year:
1993
Language:
english
DOI:
10.1117/12.161981
File:
PDF, 827 KB
english, 1993