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SPIE Proceedings [SPIE Physical Concepts of Materials for Novel Optoelectronic Device Applications II - Trieste, France (Sunday 23 May 1993)] Physical Concepts and Materials for Novel Optoelectronic Device Applications II - Time-resolved fluorescence investigation of SiC epitaxy layer
Bergner, Harald, Beltram, Fabio, Gornik, Erich, Goerlich, Ralf, Krause, A.Volume:
1985
Year:
1993
DOI:
10.1117/12.162745
File:
PDF, 654 KB
1993