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SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Tuesday 18 October 1994)] Microelectronics Manufacturability, Yield, and Reliability - Faster approach to ASIC diagnosis: LPISEM
Prasad, Sharad, Brahme, Upendra, Vasquez, Barbara, Kawasaki, HisaoVolume:
2334
Year:
1994
Language:
english
DOI:
10.1117/12.186759
File:
PDF, 290 KB
english, 1994