SPIE Proceedings [SPIE Optical Diagnostics of Materials and...

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SPIE Proceedings [SPIE Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop - Kiev, Ukraine (Thursday 6 May 1993)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Optical/digital system for measurements and diagnostics of surface properties of materials for micro- and optoelectronics

Bachevsky, Roman S., Dostojny, Volodymyr A., Muravsky, Leonid I., Stefansky, Arkadiy I., Naidich, Yurij V., Grygorenko, Mykola F., Svechnikov, Sergei V., Valakh, Mikhail Y.
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Volume:
2113
Year:
1994
Language:
english
DOI:
10.1117/12.191994
File:
PDF, 484 KB
english, 1994
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