SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics - Imaging properties of a silicon wafer x-ray telescope
Joy, Marshall K., Kolodziejczak, Jeffery J., Weisskopf, Martin C., Fair, Sara B., Ramsey, Brian D., Hoover, Richard B., Walker, Jr., Arthur B. C.Volume:
2279
Year:
1994
Language:
english
DOI:
10.1117/12.193144
File:
PDF, 275 KB
english, 1994