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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] X-Ray and Ultraviolet Spectroscopy and Polarimetry - Study of photoemission spectroscopy with polarized x-rays
Shaw, Ping-Shine, Hanany, Shaul, Liu, Yee, Novick, Robert, Santangelo, Andrea E., Manzo, Giuseppe, Fineschi, SilvanoVolume:
2283
Year:
1994
Language:
english
DOI:
10.1117/12.193194
File:
PDF, 430 KB
english, 1994