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SPIE Proceedings [SPIE SC - DL tentative - Santa Clara, CA (Thursday 8 February 1990)] Charge-Coupled Devices and Solid State Optical Sensors - Effects of transistor geometry on CCD output sensitivity
Kim, H. E., Blouke, Morley M., Heidtmann, Denis L., Blouke, Morley M.Volume:
1242
Year:
1990
Language:
english
DOI:
10.1117/12.19440
File:
PDF, 313 KB
english, 1990