SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Industrial Optical Sensors for Metrology and Inspection - Design of a commercial optical instrument for surface roughness measurement
Liu, Shou-Bin, Yu, Hui-Fen, Harding, Kevin G., Stahl, H. PhilipVolume:
2349
Year:
1995
Language:
english
DOI:
10.1117/12.198686
File:
PDF, 383 KB
english, 1995