SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Imaging and Illumination for Metrology and Inspection - High-speed, high-resolution 3D range camera
Schneiter, John, Corby, Jr., Nelson R., Haiao, Meng-Ling, Penney, Carl M., Svetkoff, Donald J.Volume:
2348
Year:
1994
Language:
english
DOI:
10.1117/12.198847
File:
PDF, 546 KB
english, 1994