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SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Imaging and Illumination for Metrology and Inspection - Line model for multisignature Gibbs classification
Greenshields, Ian R., Chun, Junchul, Svetkoff, Donald J.Volume:
2348
Year:
1994
Language:
english
DOI:
10.1117/12.198857
File:
PDF, 428 KB
english, 1994