SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation 2012 - Chengdu, China (Wednesday 8 August 2012)] Eighth International Symposium on Precision Engineering Measurement and Instrumentation - Robust CMOS camera module lens calibration by support vector machine regression
Yang, Chan-Yun, Jan, Gene Eu, Chen, Yung-Yuan, Lin, JieVolume:
8759
Year:
2013
Language:
english
DOI:
10.1117/12.2014433
File:
PDF, 542 KB
english, 2013